Test Pattern Generation and Compaction for Crosstalk Induced Glitch Faults
نویسنده
چکیده
This work proposes a TPG method for producing maximal crosstalk glitch effect on victim net by considering the spatial, temporal and functional properties of the circuits. The generated test set is then compacted initially through pattern merging and then through fault-list chaining algorithm. Finally different approaches to this algorithm are implemented for comparison.
منابع مشابه
Compaction of Test Set for Crosstalk Induced Glitch Faults using Pattern Sequencing
Detection of crosstalk induced glitch faults is important as they can result in erroneous output if the glitch effect propagates to a primary output or to an intermediate flipflop. A new method is thus presented in this paper to generate test patterns for crosstalk induced glitch faults followed by compaction of the test set. By considering the spatial and temporal aspects between the victim an...
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تاریخ انتشار 2009